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SDS7000A Digital Storage Oscilloscope

Sku: SIG-SDS7000A

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Product Information

The Siglent SDS7000A Digital Storage Oscilloscope has a sampling rate of 20 GSa/s, eliminating signal distortion. With an extended storage depth of up to 1 Gpts/ch, capture

SDS7000A Sampling Rate
SDS7000A Sampling Rate

complete signal sequences for up to 50 milliseconds at max sampling rate without any gaps. Utilise search and navigate or history tools to analyse the entire stored trace. Each sample utilises the 12-bit ADC, limiting the quantisation error, which can help engineers to observe the details of the waveform clearly and measure the waveform accurately.

 

All new high-speed platform
The processor of SDS7000A has been fully upgraded. Utilising an X86 processor greatly improves the system’s response speed, measurement, operation, and analysis speed and creates more opportunities for future expansion of analysis functions.

 

Eye/Jitter analysis

SDS7000A Protocol Consistence
SDS7000A Protocol Consistence
As the core of signal integrity analysis of high-speed systems, eye diagrams characterise high-speed communication signals. The system’s quality can be evaluated by observing the influence of inter-symbol crosstalk, noise, and bandwidth. Jitter analysis characterises the statistical distribution of small timing changes in a systems and is often used to debug digital communication systems and high-speed signal transmission. The SDS7000A series supports automatic parameter measurements for jitter and eye characterisation. Easy setup and automatic measurements speed debugging and simplify engineering design testing.

Protocol consistency

SDS7000A Jitter Analysis
SDS7000A Jitter Analysis
With the SDS7000A, SIGLENT provides embedded compliance test solutions to evaluate systems versus communication standards, including USB 2.0, 100base-TX, 1000base-T, 100base-T1 and 1000base-T1. Users can flexibly configure the test items, and the software can control the oscilloscope to automatically complete the test, and automatically give the signal test results (Pass/Fail) after comparing with the reference standards. This helps to identify and resolve critical signal and transmission issues quickly.

SAP5000D active differential probe(5GHz)

The SAP5000D is our highest performing active differential probe kit providing up to 5 GHz of bandwidth and low noise for detailed signal analysis. Its high input resistance and low input capacitance can ensure minimising the load introduced by the measurement system. SAP5000D active probe utilises the SAPBus interface, making it suitable for oscilloscopes including the SDS5000X, SDS6000A and SDS7000A series. These probes do not need an additional external power supply and are automatically recognised by the oscilloscope.
  • 4 analogue channels, up to 6 GHz bandwidth with up to 20GSa/s sample rate
  • 12-bit ADC
  • Low background noise: 260 μVrms @ 6 GHz bandwidth
  • SPO technology
  • Intelligent trigger: Edge, Slope, Pulse, Window, Runt, Interval, Dropout, Pattern, Qualified, Nth edge, Setup/hold, Delay and Video (HDTV supported). Zone Trigger simplifies advanced triggering
  • Serial bus triggering and decoder, supports protocols I2C, SPI, UART, CAN, LIN, CAN FD, FlexRay, I2S, MIL-STD-1553B, SENT, Manchester, ARINC429 and USB 2.0
  • Segmented acquisition (Sequence) mode, dividing the maximum record length into multiple segments (up to 124,000), according to trigger conditions set by the user, with a very small dead time between segments to capture the qualifying event
  • History waveform record (History) function, the maximum recorded waveform length is 124,000 frames
  • Automatic measurements on 50+ parameters, supports statistics with histogram, track, trend, Gating measurement, and measurements on Math, History and Memory traces
  • 4 Math traces (32 Mpts FFT, Filter, addition, subtraction, multiplication, division, integration, differential, square root, etc.), supports formula editor
  • Abundant data analysis functions such as Search, Navigate, SignalScan, Digital Voltmeter, Counter, Waveform Histogram, Bode plot, Power Analysis, Eye/Jitter Analysis and Compliance Test
  • High Speed hardware-based Average, Hi-Res; High Speed hardware-based Mask Test function, with Mask Editor tool for creating user-defined masks
  • 16 digital channels
  • Built-in 50 MHz waveform generator
  • Large 15.6” HD TFT-LCD display with 1920 * 1080 resolution; Capacitive touch screen supports multi-touch gestures.
  • Interfaces include: 4x USB Host 3.1 Gen 1,2x USB 3.0 Host,USB 2.0 Device,2x 1000M LAN,DVI-D,DP 1.2, HDMI 1.4,Audio, External Triger In, Aux Out (Pass/Fail, Trigger Out), 10 MHz In,10 MHz Out
  • Built-in web server supports remote control over the LAN port using a web browser. Supports SCPI remote control commands. Supports external mouse and keyboard
Bandwidth 3、4 、6GHz
Sample Rate(Max.) 20 GSa/s (dual-channel)
10 GSa/s (3 or 4 channels)
Waveform capture rate(Max.) 1,000,000 wfm/s
Analogue channels 4 + EXT
Trigger type Edge, Slope, Pulse width, Window, Runt, Interval, Dropout, Pattern, Video, Qualified, Nth edge, Setup/hold, Delay, Serial
Serial trigger and decode Standard: I2C, SPI, UART, CAN, LIN
Optional: CAN FD, FlexRay, I2S, MIL-STD-1553B, SENT, Manchester (decode only), ARINC429, USB 2.0 (decode only)
Data analysis Search, Navigate, History, Mask Test, Digital Voltmeter, Counter, Waveform Histogram, Bode plot and Power Analysis, Eye/Jitter Analysis, SignalScan, Compliance Test (USB 2.0, 100Base-TX, 1000Base-T, 100Base-T1, 1000Base-T1)
Digital channel 16-channel; maximum sample rate up to 1 GSa/s;
record length up to 50 Mpts
Waveform generator (optional) Builit-in, frequency up to 50 MHz, 125 MSa/s sample rate, 16 kpts waveform memory
I/O 4x USB Host 3.1 Gen 1,2x USB 3.0 Host,USB 2.0 Device (USBTMC),2x 1000M LAN (VXI-11+SCPI, Telnet (5024)+SCPI,Socket (5025)+SCPI,LXI,WebServer)
Display: 1x DVI-D: up to 1920×1200 @ 60Hz; 1x DP 1.2: up to 4096×2304 @ 60Hz; 1x HDMI 1.4: up to 4096×2160 @ 60Hz
Audio: Mic input, Audio Output
Others: External Trigger In, Aux Out (TRIG OUT,PASS/FAIL),10 MHz In,10 MHz Out
Probe (standard) 500 MHz, 1 probe supplied for each channel
Display 15.6” HD TFT-LCD with capacitive touch screen (1920*1080)
Model Bandwidth Channel Sampling Rate Waveform Update Rate Memory Depth
SDS7304A H12  3 GHz 4 + EXT 20 GSa/s (dual-channel) 1,000,000 wfm/s Standard: 500 Mpts/ch Optional: 1 Gpts/ch
SDS7404A H12  4 GHz 4 + EXT 20 GSa/s (dual-channel) 1,000,000 wfm/s Standard: 500 Mpts/ch Optional: 1 Gpts/ch
SDS7604A H12  6 GHz 4 + EXT 20 GSa/s (dual-channel) 1,000,000 wfm/s Standard: 500 Mpts/ch Optional: 1 Gpts/ch
Model Bandwidth Channel Sampling Rate Waveform Update Rate Memory Depth
SDS7304A H12 

 

3 GHz

 

4 + EXT

 

20 GSa/s (dual-channel)

 

1,000,000 wfm/s

 

Standard: 500 Mpts/ch Optional: 1 Gpts/ch

 

SDS7404A H12 

 

4 GHz

 

4 + EXT

 

20 GSa/s (dual-channel)

 

1,000,000 wfm/s

 

Standard: 500 Mpts/ch Optional: 1 Gpts/ch

 

SDS7604A H12 

 

6 GHz

 

4 + EXT

 

20 GSa/s (dual-channel)

 

1,000,000 wfm/s

 

Standard: 500 Mpts/ch Optional: 1 Gpts/ch
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